Categoria: Seminari e Convegni
Stato: Archiviata
30-31 May 2019

Mathematical and Statistical Methods for Metrology

Recognizing the increasing need of ad hoc and innovative mathematical and statistical tools for current and emerging metrological applications in the several areas of the Science of Measurements, itENBIS ( and INRIM ( propose a joint Workshop on Mathematical and Statistical Methods for Metrology.

Session topics include but are not limited to:
- Interlaboratory data evaluation
- Uncertainty and measurement quality evaluation
- Regression and inverse models
- High dimensional, dynamic and complex models
- Bayesian models
- Simulated experiments and computational methods
- Machine Learning, artificial intelligence and Big Data analytics
- Statistical engineering
- Design of experiments
- Sampling and sequential design
- Time series analysis
- Conformity assessment, reliability and quality control
- Chemometrics
- Biostatistics

Upon agreement with the corresponding Editors-in-Chief, Statistica Applicata – Italian Journal of Applied Statistics, Measurement Science and Technology and Accreditation and Quality Assurance journals are ready to host a special issue dedicated to the workshop.

The call for submission of papers to these special issues will be in June 2019.

At the Workshop there will be the two following invited speakers:

Anthony O'Hagan – Emeritus Professor of Statistics, School of Mathematics and Statistics, The University of Sheffield (UK) (;
Giulio D'Agostini – Professor of the Physics Department of the University of Rome "La Sapienza", Roma (Italy) and INFN Roma 1 (

Instructions on how to upload the abstracts, as well as details on registration, travel and accommodation are on the event website, which is updated on a continuous basis.

Queries can be addressed to the organizers (